ICST 2013 - CALL FOR PAPERS
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      6th IEEE International Conference on Software Testing,
                  Verification, and Validation
                           (ICST 2013)

                  March 18-22, 2013, Luxembourg

                      http://www.icst.lu/ 
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NEW - MENTORING PROGRAM: Deadline July 3, 2012

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Important Dates:
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* Papers (research/industry tracks)
  Paper submission: Sep. 17, 2012
  Authors notification: Dec. 14, 2012
  Camera-ready: Jan. 9, 2013

* Workshops
  Submission of proposals: Sep. 29, 2012
  Notification: Oct. 31, 2012

* Ph.D. Symposium
  Paper submission: Nov. 14, 2012
  Authors notification: Dec. 14, 2012

* Mentoring Program - NEW!
  Paper submission: Jul. 3, 2012
  Mentoring until sept. 7, 2012

* Testing Tools Track - NEW!
  Submissions period: Sep. 17, 2012 - Dec. 4, 2012
  On the fly selection

* Posters
  Submission: Feb. 9, 2013
  Authors notification:  Feb. 23, 2013

* Dates of conference
  Main conference: Mar. 19-21, 2013
  Workshop days: Mar. 18 and 22, 2013

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Submissions:
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The IEEE International Conference on Software Testing, Verification, and
Validation (ICST) is the premier conference for research in all areas related to
software quality. The ever increasing complexity, ubiquity, and dynamism of
modern software systems is making software quality assurance activities, and in
particular software testing and analysis, more challenging. ICST provides an
ideal forum where academics, industrial researchers, and practitioners can
present their latest approaches for ensuring the quality of today's complex
software systems, exchange and discuss ideas, and compare experiences. In this
spirit, ICST welcomes both research papers that present high quality original
work and industry reports from practitioners that present real world experiences
from which others can benefit.

Each submission will be reviewed by at least three members of the ICST Program
Committee. Authors of the best papers presented at ICST 2013 will be invited to
extend their work for possible inclusion in a special issue of Software Testing,
Verification, and Reliability, a Wiley journal.

Topics of interest include, but are not limited to:
- Testing theory and practice
- Testing in globally-distributed organizations
- Model-based testing
- Model-driven development and testing
- Domain specific testing, such as:
- Security testing
- Web-service testing
- Database testing
- Embedded-software testing
- Testing concurrent software
- Testing large-scale distributed systems
- Testing in multi-core environments
- Validation testing
- Quality assurance
- Model checking
- Metrics and empirical studies
- Fuzzing
- Inspections
- Testing and analysis tools
- Design for testability
- Testing education
- Technology transfer in testing
- Agile/iterative/incremental testing processes
- Testing of open source and third-party software
- Software reliability
- Performance and QoS testing
- Standards
- Formal verification
- Experience reports

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Organization
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- General Chair
Yves Le Traon, University of Luxembourg, Luxembourg

- Program Chairs
Benoit Baudry, INRIA-Bretagne Atlantique, France
Alessandro Orso, Georgia Institute of Technology, USA

- Organizing Chair
Jacques Klein, University of Luxembourg, Luxembourg

- Workshop Chairs
Gordon Fraser, University of Sheffield, UK
Levi Lucio, McGill University, Canada

- Ph.D. Symposium Chairs
Jeff Offutt, George Mason University, USA
Hyunsook Do, North Dakota State University, USA

- Mentoring Program Chair
Per Runeson, Lund University, Sweden

- Testing Tools Track Chair
Manuel Oriol, ABB, Switzerland

- Poster Chairs
Roland Groz, LSR-IMAG, France
Tanja Vos, Universidad Politecnica de Valencia, Spain

- Publication Chair
Martin Monperrus, University of Lille, France

- Industrial Chair
Sigrid Eldh, Ericsson, Sweden

- Publicity Chairs
Eduardo Cunha de Almeida, Federal University of Parana, Brazil
Fabrice Bouquet, INRIA, France
Yue Jia, CREST, UK
James A. Jones, University of California Irvine, USA
Eda Marchetti, CNR, Italy
Mercedes G. Merayo, Universidad Complutense de Madrid, Spain
Gilles Perrouin, University of Namur, Belgium
Stephan Weissleder, Fraunhofer Institute, Germany
Ji Wu, Beihang University, China
Vipul Shah, Tata Consultancy Services, India

- Financial Chair
Laurent Betry, University of Luxembourg, Luxembourg

- Local Arrangements Chairs
Cecile Petit, University of Luxembourg, Luxembourg
Stephanie Annet, University of Luxembourg, Luxembourg
Ragnhildur Edda Eyjolfsdottir, University of Luxembourg, Luxembourg

- Webmasters
Phu Nguyen, University of Luxembourg, Luxembourg
Christopher Henard, University of Luxembourg, Luxembourg

- Steering Committee
Benoit Baudry, IRISA/INRIA, France
Antonia Bertolino, CNR, Italia
Lionel Briand, University of Luxembourg, Luxembourg
Ana Cavalli, Telecom&Management SudParis, France
Gordon Fraser, University of Sheffield, UK
Yvan Labiche, Carleton University, Canada
Atif Memon, University of Maryland, USA
Gregg Rothermel, University of Nebraska, USA
Ina Schieferdecker, Technical University Berlin, Germany

- Program Committee
Paul Ammann, George Mason University, USA
James Andrews, University of Western Ontario,  Canada
Giuliano Antoniol, Ecole Polytechnique de Montreal, Canada
Paul Baker, Visa, UK
Thomas Ball, Microsoft Research, USA
Cristiano Bertolini, United Nations University, China
Antonia Bertolino, ISTI-CNR, Italy
Kirill Bogdanov, The University of Sheffield, UK
Fabrice Bouquet, University of Franche-Comte, France
Renee Bryce, Utah State University, USA
Tevfik Bultan, University of California Santa Barbara, USA
Cristian Cadar, Imperial College London, UK
Jeffrey Carver, University of Alabama, USA
Byoungju Choi, Ewha Womans University, Korea
James Clause, University of Delaware, USA
Myra Cohen, University of Nebraska-Lincoln, USA
Christoph Csallner, University of Texas at Arlington, USA
Massimiliano Di Penta, RCOST - University of Sannio, Italy
Lydie Du Bousquet, Universite' Joseph Fourier, France
Matt Dwyer, University of Nebraska-Lincoln, USA
Sigrid Eldh, Ericsson / Karlstad University, Sweden
Franck Fleurey, SINTEF, Norway
Phyllis Frankl, Polytechnic University, USA
Gordon Fraser, University of Sheffield, UK
Sudipto Ghosh, Colorado State University, USA
Arnaud Gotlieb, INRIA, France
Mark Grechanik, University of Illinois at Chicago, USA
William G.J. Halfond, University of Southern California, USA
Mark Harman, University College London, UK
Mary Jean Harrold, Georgia Institute of Technology, USA
Toru Hasegawa, KDDI R&D Laboratories,  Inc.,Japan
Natalia Juristo, Universidad Politecnica de Madrid, Spain
Gail Kaiser, Columbia University, USA
Aditya Kanade, Indian Institute of Science, India
Gregory Kapfhammer, Allegheny College, USA
Sarfraz Khurshid, University of Texas at Austin, USA
Johannes Kinder, Ecole Polytechnique Federale de Lausanne, Switzerland
Pieter Kritzinger, University of Cape Town, South Africa
Bruno Legeard, Smartesting, France
Yu Lei, University of Texas at Arlington, USA
Jose' Carlos Maldonado, ICMC-USP, Brasil
Leonardo Mariani, Universita' di Milano Bicocca, Italy
Wes Masri, American University of Beirut, Lebanon
Phil Mcminn, University of Sheffield, UK
Ali Mesbah, University of British Columbia, Canada
Tejeddine Mouelhi, University of Luxembourg, Luxembourg
Henry Muccini, University of L'Aquila, Italy
Nachiappan Nagappan, Microsoft Research, USA
Brian Nielsen, Aalborg University, Denmark
Manuel Nunez, UCM, Spain
Jeff Offutt, George Mason University, USA
Mauro Pezze', University of Lugano, Switzerland
Lori Pollock, University of Delaware, USA
Alexander Pretschner, Karlsruhe Institute of Technology (KIT), Germany
Brian Robinson, ABB Inc. - US Corporate Research, USA
Abhik Roychoudhury, National University of Singapore, Singapore
Antonino Sabetta, SAP Research Sophia-Antipolis, France
Max Schaefer, IBM Research, USA
Saurabh Sinha, IBM Research - India, India
Paul Strooper, University of Queensland, Australia
Lin Tan, University of Waterloo, Canada
Nikolai Tillmann, Microsoft Research, USA
Paolo Tonella, Fondazione Bruno Kessler, Italy
Andreas Ulrich, Siemens AG, Germany
Willem Visser, Stellenbosch University, South Africa
Tanja Vos, Universidad Politecnica de Valencia, Spain
Stephan Weissleder, Fraunhofer Institute, Germany
Michael Whalen, University of Minnesota, USA
Laurie Williams, North Carolina State University, USA
Andreas Windisch, Technische Universitat Berlin, Germany
Claes Wohlin, Blekinge Institute of Technology, Sweden
Ji Wu, Beihang University, China
Michal Young, University of Oregon, USA
Andreas Zeller, Saarland University, Germany
Xiangyu Zhang, Purdue University, USA